Test procedure in which an assembly's overall operational characteristics are tested by simulating normal function. Syn: go/no-go test.

a procedure whereby a newly manufactured device is tested whilst being electrically stimulated in a way similar to the way in which it will eventually be used

a test in which an input is applied and an output is observed

a test that helps you determine whether a system functions as intended

a test you can't run until the app is packaged and deployed in some way

A test that is performed to ensure that features are present and functioning as described in the functional specification.

Test procedure that simulates the operation of a certain assembly. Used to screen lots for defective units.

A test designed to demonstrate the ability of a device to correctly perform one or more intended functions over some range of input conditions and internal states.

Testing that ignores the internal mechanism of a system (or system component) and focuses solely on the outputs generated in response to selected inputs and execution conditions. Same as black-box testing.

The electrical testing of an assembled electronic device with simulated function generated by the test hardware and software.

A form of test that focuses on exercising the UUT and checking its operation or functionality. Analogue measurements may be made as required to ensure they are within specification.